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ATE Test Engineer(J11618)

单位:豪威类型:社招地点:北京市更新:2026-09-24

岗位信息

招聘单位豪威
工作地点北京市
官方更新时间2026-07-16T16:05:01

职位描述

1.Responsible for the development, debugging, optimization and maintenance of CIS test programs to ensure stable and reliable testing.

2.Responsible for the entire process of Probe Card design requirements, PCB review, etc., excluding manufacturing.

3.Analyze test data, defective products and yield, and propose yield improvement solutions.

4.Analyze CCN and customer complaint issues, and update/release new program.

5.Cooperate with R&D, QA and production teams to support new product introduction, pilot run and mass production.

任职要求

1. Bachelor's degree or above in Electronics, Computer Science, Automation or related majors.

2. 1-3 years of experience in ATE chip test program development is required; candidates with CIS test experience are preferred; those familiar with test equipment such as Chroma, CZ, KYEC E320 are preferred; familiarity with embedded microcontrollers (51, ST) and C language is preferred.

3. Strong ability in problem analysis and solving, careful and rigorous, with good communication and teamwork skills.

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